data-driven stochastic collocation approach for uncertainty quantification in MEMS




FREE-DOWNLOADN Agarwal… – Int. J. Numer. Meth. Engng, 2010 –
This work presents a data-driven stochastic collocation approach to include the effect of uncertain
design parameters during complex multi-physics simulation of Micro-ElectroMechanical Systems
(MEMS). The proposed framework comprises of two key steps: first, probabilistic .