Impact of interconnect pattern density information on a 90nm technology ASIC design flow
FREE-DOWNLOAD P Zarkesh-Ha, S Lakshminarayann, K Doniger… – 2003
The importance of an interconnect pattern density model in ASIC design flow for a 90nm technology
is presented. It is shown that performing the timing analysis at the worst-case corner model for
interconnect variation, without the knowledge of interconnect pattern density, often results .
The coincidence matrix ASIC of the level-1 muon barrel trigger of the ATLAS experiment
ASIC and FPGA implementations of H. 264 DCT and quantization blocks
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