Structural characterization of bimetallic nanomaterials


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Structural characterization of bimetallic nanomaterials with overlapping x-ray absorption edges

FREE-DOWNLOADLD Menard, Q Wang, JH Kang, AJ Sealey… – Physical Review B, 2009
We describe a data analysis method for extended x-ray absorption fine structure spectroscopy
suitable for use with compounds of diverse form that contain overlapping absorption edges. This
method employs direct concurrent analysis of the data—demonstrated here for cases 




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