Stimulus generator for SEIR method based ADC BIST

FREE-DOWNLOAD [PDF] J Duan, B Vasan, C Zhao… – … ), Proceedings of the …, 2009
Testing of ADC in SOC is a significant challenge since it usually has no connection
to the outside. Built-in self-test (BIST) is regarded as a promising alternative to traditional
test. Most reported ADC BIST research works try to replicate a production test scheme on