ADC in embedded systems
Economical test of internal ADC in embedded systems
FREE-DOWNLOAD [PDF] J Vedral, J Svatoš… – … of XIX IMEKO World Congress, Lisbon …, 2009
Abstract – This paper describes two methods for economical test of dynamic parameters ADCs
in embedded Data Acquisition Systems. First method is Exponential Fit Test, second method
is Wobbler Test. Common testing methods are mentioned as far the accuracy and time