ADC linearity testing


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High-resolution ADC linearity testing using a fully digital-compatible BIST strategy

FREE-DOWNLOAD [PDF] H Xing, H Jiang, D Chen… – … and Measurement, research …, 2009
Abstract—This paper proposes a digital-compatible built-in self-test (BIST) strategy for high-resolution
analog-to-digital converter (ADC) linearity testing using only digital testing envi- ronments. The
on-chip stimulus generator consists of three low- resolution and low-accuracy current 




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