DSP based ramp test for on-chip high resolution ADC



FREE-DOWNLOAD W Jiang… – System Theory (SSST), 2011 research 43rd …, 2011
Abstract—Ramp test approach is widely used in analog-to- digital converter (ADC) built-in
self-test (BIST), which gener- ates linear and slow-slope analog ramp signals intended for
histogram-based non-linearity test. The test time can be high for high-resolution ADCs. In




COMMENT DSP, electronics, free research papers



 

FREE IEEE PAPER