Fast Thermal Analysis of Vertically Integrated Circuits (3-D ICs) Using Power Blurring Method
FREE-DOWNLOAD JH Park, A Shakouri… – Proc. of the InterPACK …, 2009
. ABSTRACT CMOS VLSI technology has been facing various technical challenges as the feature
sizes scales down. . INTRODUCTION The evolution of CMOS VLSI technology has been driven
by two main motives: to increase functionality and functional density.