Fast Thermal Analysis of Vertically Integrated Circuits (3-D ICs) Using Power Blurring Method



FREE-DOWNLOAD JH Park, A Shakouri… – Proc. of the InterPACK …, 2009
. ABSTRACT CMOS VLSI technology has been facing various technical challenges as the feature
sizes scales down.  . INTRODUCTION The evolution of CMOS VLSI technology has been driven
by two main motives: to increase functionality and functional density.



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