Fault isolation with intermediate checks of end-to-end checksums in the Time-TriggeredSystem-on-Chip Architecture


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FREE-DOWNLOAD H Paulitsch, C Paukovits… – … Systems, 2009. SIES’09. …, 2009
The scaling of semiconductor devices consid- erably improves their performance at the cost of
higher error rates for a given die area, particularly due to transient and intermittent faults. The
reli- ability of semiconductors can be compromised by permanent, transient, and




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