test pattern compaction in vlsi
Simultaneous test pattern compaction, ordering and X-filling for testing power reduction
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JY Lee, Y Hu, R Majumdar… – Quality of Electronic Design …, 2009
Page 1. Simultaneous Test Pattern Compaction, Ordering and X-Filling for Testing Power
Reduction … In order to reduce test data volume when testing, static test pattern compaction has
been proposed [9] to reduce both test data volume and power dissipation.