test pattern compaction in vlsi




Simultaneous test pattern compaction, ordering and X-filling for testing power reduction
FREE DOWNLOAD [PDF]
JY Lee, Y Hu, R Majumdar… – Quality of Electronic Design …, 2009
Page 1. Simultaneous Test Pattern Compaction, Ordering and X-Filling for Testing Power
Reduction … In order to reduce test data volume when testing, static test pattern compaction has
been proposed [9] to reduce both test data volume and power dissipation.






IEEE PAPER UNITED STATES