Crosstalk Delay Faults in vlsi


Simulation Based ATPG for Crosstalk Delay Faults in VLSI Circuits using Genetic Algorithm

FREE-DOWNLOAD S Jayanthy, MC Bhuvaneswari – ICGST-AIM Journal, 2009 –
Abstract As design trends move toward nanometer technology, new Automatic Test Pattern Generation
(ATPG) problems are emerging. During design validation, the effect of crosstalk on reliability
and performance cannot be ignored. So new ATPG Techniques has to be developed for 


IEEE-PAPER




COMMENT analog, free research papers, vlsi




  • FREE IEEE PAPER
    IEEE-PROJECT


    Crosstalk Delay Faults in vlsi IEEE PAPER



    IEEE PROJECTS IEEE PAPERS EEE CSE ECE FREE DOWNLOAD PDF COMPUTER SCIENCE NEW IEEE PROJECTS IEEE MINI PROJECTS USA