Crosstalk Delay Faults in vlsi
Simulation Based ATPG for Crosstalk Delay Faults in VLSI Circuits using Genetic Algorithm
FREE-DOWNLOAD S Jayanthy, MC Bhuvaneswari – ICGST-AIM Journal, 2009 –
Abstract As design trends move toward nanometer technology, new Automatic Test Pattern Generation
(ATPG) problems are emerging. During design validation, the effect of crosstalk on reliability
and performance cannot be ignored. So new ATPG Techniques has to be developed for
Related
power distribution network in VLSI circuits
simulation of VLSI networks
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