low power testing of vlsi


Low power testing of VLSI circuits: Problems and solutions
FREE DOWNLOAD [PDF] 
P Girard – Quality Electronic Design,
Abstract Power and energy consumption of digital systems may increase significantly during
testing. This extra power consumption due to test application may give rise to severe
hazards to the circuit reliability. Moreover, it may be responsible for cost, performance 



COMMENT free research papers, vlsi



 







FREE IEEE PAPER