PSP MOSFET model-2


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Statistical modeling with the PSP MOSFET model

FREE DOWNLOAD [PDF] X Li, CC McAndrew, W Wu… – … -Aided Design of …, 2010 –
Abstract—PSP and the backward propagation of variance (BPV) method are used to characterize
the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV
statistical modeling of NMOS and PMOS devices is, for the first time, coupled by including 




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