Crosstalk Delay Faults in vlsi


Simulation Based ATPG for Crosstalk Delay Faults in VLSI Circuits using Genetic Algorithm

FREE-DOWNLOAD S Jayanthy, MC Bhuvaneswari – ICGST-AIM Journal, 2009 –
Abstract As design trends move toward nanometer technology, new Automatic Test Pattern Generation
(ATPG) problems are emerging. During design validation, the effect of crosstalk on reliability
and performance cannot be ignored. So new ATPG Techniques has to be developed for 

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