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Testing, Reliability, and Reliability Prediction

Zimmermann, T., Nagappan, N. Herzig, K., Premraj, R. and Williams, L., An Empirical Study on the Relation between Dependency Neighborhoods and Failures, International Conference on Software Testing, Verification, and Validation (ICST) 2011, Berlin, to appear.
Syed, R., Robinson, B., and Williams, L. Does Hardware Configuration and Processor Load Impact Software Fault Observability?, International Conference on Software Testing, Verification, and Validation (ICST) 2010, Paris, France, pp.285-294.
Williams, L., Kudrjavets G., Nagappan, N., On the Effectiveness of Unit Test Automation at Microsoft, International Symposium on Software Reliability Engineering (ISSRE) 2009, Mysuru, India, pp. 81-89.
Smith, B. and Williams, L., On Guiding the Augmentation of an Automated Test Suite via Mutation Analysis, Empirical Software Engineering, Volume 14, Issue 3, Page 341-369, June 2009.
Smith, B. and Williams, L., Should Software Testers use Mutation Analysis to Augment a Test Set?, Journal of Systems Software, vol. 82, no. 11, pp. 1819-1832, 2009.
Meneely, A., Williams, L., Snipes, W., and Osbourne, J., Predicting Failures with Developer Networks and Social Network Analysis, ACM SIGSOFT Foundations of Software Engineering (FSE) 2008, Atlanta, GA, pp. 13-23.
Nagappan, N., E. M. Maximilien, Bhat, T., and Williams, L. Realizing Quality Improvement Through Test Driven Development: Results and Experiences of Four Industrial Teams, Empirical Software Engineering, Vol. 13, No. 3, June 2008, pp. 289-302.
Smith, B. and Williams, L., An Empirical Study of MuJava Mutation Operators, Windsor, UK: Mutation 2007.
Sherriff, M., Lake, M., and Williams, L., Prioritization of Regression Tests Using Singular Value Decomposition with Empirical Change Records, research International Symposium on Software Reliability Engineering (ISSRE) 1007, Trollhättan, Sweden, pp. 81-90.
Nagappan, N., Williams, L., Vouk, M., and Osborne, J.,Using In-Process Testing Metrics to Estimate Post-Release Field Quality of Java Programs, research International Symposium on Software Reliability Engineering (ISSRE) 1007, Trollhättan, Sweden, pp. 81-90.
Meneely, A., Williams, L., and Snipes, W., System Test Case Prioritization, Using Static Metrics and System Failure Data,, research International Symposium on Software Reliability Engineering (ISSRE) 1007, Trollhättan, Sweden student paper
Sherriff, M., Heckman, S., Lake, M., Williams, L., Using Grouping of Static Analysis Alerts to Identify Files Likely to Contain Field Failures, ACM SIGSOFT Foundations of Software Engineering Short Paper, to appear.
Johnson, M., Ho, C-w, Maximilien, M., and Williams, L., Incorporating Performance Testing in Test-Driven Development, research Software, Vol. 24, No., 3, pp. 67-73, May/June 2007.
Sherriff, M. and Williams, L., DevCOP: A Software Certificate Management System for Eclipse, International Symposium for Software Reliability Engineering (ISSRE) 2006, Raleigh, NC, pp. 375-384.
Zheng, J., Williams, L., Robinson, B., Smiley, K., Regression Test Selection for Black Box Dynamic Link Library Components, 2nd Intl. Workshop on Incorporating COTS Software into Software Systems (IWICSS 2007) at the International Conference on Software Engineering (ISCE) 2007, Minneapolis, MN
Williams, L., Snipes, W., and Meneely, A., On Increasing System Test Effectiveness through a Test Case Prioritization Model Using Static Metrics and System Failure Data, Reliability Analysis of System Failure Data Workshop, Cambridge, UK, 2007
Ho, Chih-wei and Williams, L., Developing Software Performance with the Performance Refinement and Evolution Model, Workshop on Software Performance (WOSP), Buenos Aires, Argentina, pp. 133-136, 2007.
Heckman, S., Williams, L., Automated Adaptive Ranking and Filtering of Static Analysis Alerts, Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2006, Raleigh, NC, ISBN 978-0-9671473-3-3-8
Zheng, J., Williams, L., Robinson, B., Smiley, K., Identifying Change in Dynamic Link Library COTS Components when Source Code is Not Available, Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2006, Raleigh, NC, ISBN 978-0-9671473-3-3-8.
Williams, L., Teaching an Active Participation Course in Software Reliability and Testing, “ How Should Software Reliability Engineering Be Taught?” Panel Paper at the research International Symposium of Software Reliability Engineering 2005, Chicago, IL.
Garzia, M., Hudepohl, J., Snipes, W., Lyu, M. Musa, J., Smidts, C., Williams, L., How Should Software Reliability Engineering (SRE) be Taught?, Software Engineering Notes, Vol. 31, No., 4, pp. 1-5, July 2006.
Zheng, J., Robinson, B., Williams, L., and Smiley, K., Applying Test Case Selection for COTS-based Applications, International Conference on Software Engineering (ICSE) 2006, Shanghai, pp. 512-521.
Zheng, J., Williams, L., Snipes, W., Nagappan, N., Hudepohl, J., Vouk, M., On the Value of Static Analysis Tools for Fault Detection, research Transactions on Software Engineering, Vol. 32, No., 4, pp. 240-253, April 2006.
Zheng, J., Robinson, B., Williams, L., Smiley, K., An Initial Study of a Lightweight Process for Change Identification and Regression Test Selection When Source Code is Not Available , International Symposium on Software Reliability Engineering (ISSRE) 2005, Chicago, IL, pp. 225-234.
Nagappan, N., Williams, L., Osborne, J., Vouk, M., Abrahamsson, P., Providing Test Quality Feedback Using Static Source Code and Automatic Test Suite Metrics, International Symposium on Software Reliability Engineering (ISSRE) 2005, Chicago, IL, pp. 85-94.
Strom, M., Davidsson, M., Williams, L., Vouk, M., The Good Enough Reliability Tool (GERT) – Version 2 , Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2005, Chicago, pp. 4.35-4.36.
Sherriff, M. and Williams, L., Certification of Code During Development to Provide an Estimate of Defect Density , Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2005, Chicago, pp. 4.47-4.48.
Smith, S., Williams, L., Xu, J., Expediting Programmer AWAREness of Anomalous Code , Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2005, Chicago, pp. 4.49-4.50.
Zheng, J., Robinson, B., Williams, L., Smiley, K., A Lightweight Process for Change Identification and Regression Test Selection in Using COTS Components, International Conference on COTS-Based Software Systems, Orlando, FL, pp. 137-143.
Sherriff, M. and Williams, L., A Method for Validation and Verification Certificates in Eclipse, Workshop on Software Certificate Management (SoftCeMent) at Automated Software Engineering (ASE) 2005, Long Beach, CA.
Srikanth, H., Williams, L., Osborne, J., System Test Case Prioritization of New and Regression Test Cases, International Symposium on Empirical Software Engineering (ISESE) 2005, Noosa Head pp. 63-73, .
Zheng, J., Robinson, B., Williams, L., Smiley, K., A Process for Identifying Changes When Source Code is Not Available, Second International Workshop on Models and Processes for the Evaluation of Off-the-Shelf Components at the International Conference on Software Engineering (ICSE) 2005, St. Louis.
Sherriff, M., Nagappan, N., Williams, L., Vouk, M., Early Estimate of Defect Density Using an In-Process Haskell Metrics Model, First International Workshop on Advances in Model-Based Software Testing (A-MOST) at the International Conference on Software Engineering (ICSE) 2005, St. Louis.
Nagappan, N., Williams, L., Vouk, M., Osborne, J., Early Estimation of Software Quality Using In-Process Testing Metrics: A Controlled Case Study, Third Workshop on Software Quality at the International Conference on Software Engineering (ICSE) 2005, St. Louis.
Srikanth, H., and Williams, L., Requirements-Based Test Case Prioritization , Grace Hopper Poster, 2004, Chicago, IL
Nagappan, N., Williams, L., Vouk, M., Osborne, J., Using In-Process Testing Metrics to Estimate Software Reliability: A Feasibility Study, Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2004, St. Malo, France, November 2004.
Sherriff, M., Williams, L., Vouk, M., Using In-Process Metrics to Predict Defect Density in Haskell Programs , Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2004, St. Malo, France, November 2004 .
Sherriff, M. and Williams, L. Tool Support for Estimating Software Reliability in Haskell Programs, Student Paper. The 15th International Symposium on Software Reliability Engineering, St-Malo, France, Nov 2-5, 2004. pp. 61-62.
Williams, L. On the Need for a Process for Making Reliable Quality Comparisons with Industrial Data, Workshop on Empirical Research in Software Testing (WERST’2004) in conjunction with the International Symposium on Software Testing and Analysis (ISSTA 2004), Boston, MA.
Nagappan, N., Williams, L., Vouk, M., Hudepohl, J., Snipes, W., A Preliminary Investigation of Automated Software Inspection , research International Symposium on Software Reliability Engineering 2004, St. Malo, France, pp. 429-439.
Davidsson, M., Zheng, J., Nagappan, N., Williams, L., Vouk, M., GERT: An Empirical Reliability Estimation and Testing Feedback Tool , research International Symposium on Software Reliability Engineering 2004, St. Malo, France, pp. 269-280.
Nagappan, N., Williams, L., and Vouk, M., Toward a Metric Suite for Early Software Reliability Estimation , Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2003, Denver, CO.
Nagappan, N., Williams, L., and Vouk, M., “Good Enough” Software Reliability Estimation Plug-In for Eclipse , Eclipse Technology Exchange (Workshop) at the Object-Oriented Programming, Systems, Languages, and Applications (OOPSLA) 2003, Anaheim, CA.
George, B. and Williams,L., A Structured Experiment of Test-Driven Developmen (early version), Information and Software technology, Vol. 46, No. 5, pp 337-342, April 2004.
Williams, L., Maximillien, M., and Vouk, M., Test-Driven Development as a Defect-Reduction Practice, research International Symposium on Software Reliability Engineering (ISSRE) 2003, Denver, CO, pp. 34-45.
Maximillien, M. and Williams, L., Assessing Test-Driven Development at IBM, International Conference on Software Engineering 2003, Portland, OR, pp. 564-569.
George, B. and Williams, L., An Initial Investigation of Test-Driven Development in Industry, ACM Symposium on Applied Computing (SAC), March 2002, Melbourne, FL, pp. 1135-1139.
Williams, L., Wang, L., Vouk, M., “Good Enough” Reliability for Extreme Programming, Fast Abstract at the International Symposium on Software Reliability Engineering (ISSRE) 2002, Anapolis, VA.


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